Referenced Items are not available for this document.
This paper gives the history of the development of the first X-Band solid-state radar developed at Texas Instruments 1964-1970, which has pointed the way to todaypsilas MIC and MMIC technology for microwave and millimeter-wave applications.
Published in:
Microwave Symposium Digest, 2008 IEEE MTT-S International
Date of Conference: 15-20 June 2008
- Page(s):
- 707 - 710
- ISSN :
- 0149-645X
- E-ISBN :
- 978-1-4244-1781-0
- Print ISBN:
- 978-1-4244-1780-3
- INSPEC Accession Number:
- 10399006
- Conference Location :
- Atlanta, GA
- Digital Object Identifier :
- 10.1109/MWSYM.2008.4632930
- Product Type:
- Conference Publications
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