Referenced Items are not available for this document.
As continuous process scaling produces large-scale chips, small-delay defects become one of the major chip-reliability limiters. Small-delay defect detection techniques for LSI screening have been developed, which can successfully detect outlier chips among normally-distributed chips in a short testing time. In our experiments with 90 nm CMOS 100 MHz test chips, we have successfully detected around 1-ns path-delay shift caused by small-delay defects in only 1/25 of testing time.
Published in:
VLSI Circuits, 2008 IEEE Symposium on
Date of Conference: 18-20 June 2008
- Page(s):
- 64 - 65
- E-ISBN :
- 978-1-4244-1805-3
- Print ISBN:
- 978-1-4244-1804-6
- INSPEC Accession Number:
- 10153550
- Conference Location :
- Honolulu, HI
- Digital Object Identifier :
- 10.1109/VLSIC.2008.4585953
- Product Type:
- Conference Publications
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