By Topic

On charge injection in analog MOS switches and dummy switch compensation techniques

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
C. Eichenberger ; Electron. Lab., Swiss Fed. Inst. of Technol., Zurich, Switzerland ; W. Guggenbuhl

Theoretical and experimental results of the clock-feedthrough phenomenon (charge injection) in sample-and-hold circuits using minimum feature size transistors of a self-aligned 3-μm CMOS technology are compared. The lumped RC model of the conductive channel has been used and verified in different switch configurations, including variable input voltages. Special emphasis is laid on the feasibility and limits of charge cancellation techniques using dummy switch designs

Published in:

IEEE Transactions on Circuits and Systems  (Volume:37 ,  Issue: 2 )