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Numerical characterization and evaluation of ESD induced field and coupling on interconnection cable

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2 Author(s)
X. K. Gao ; Institute of High Performance Computing, 1 Science Park Road, Science Park II, Singapore, 117528 ; E. P. Li

The paper presents a numerical study of the electrostatic discharge and its induced field radiation onto the interconnection cable. The device under test with the cable is modeled by introducing a finite integration technique (FIT) method. The field coupling on signal traces of interconnection cable is simulated. Different configuration of the cable is therefore proposed. The coupled voltages are analyzed and compared. The simulation results are in agreement with practical experiment. The measure to improve the electrostatic discharge immunity of cable is therefore discussed.

Published in:

Electromagnetic Compatibility and 19th International Zurich Symposium on Electromagnetic Compatibility, 2008. APEMC 2008. Asia-Pacific Symposium on

Date of Conference:

19-23 May 2008