IEEE.org| IEEE Xplore Digital Library| IEEE Standards| IEEE Spectrum| More Sites

Cart (Loading....) | Create Account | 

Close category search window
Author Searchbeta |  Advanced Search  |  Preferences |  Search Tips  |  More Search Options  
 
Browse Conference Publications > Electromagnetic Compatibility ... Help

An improved subgridding method with the second-order accurate FDTD technique at the dielectric interface

Full Text Sign-In or Purchase

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing! close button
puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Hai Ding ; Sch. of Electron. & Inf. Eng., South China Univ. of Technol., Guangzhou ; Qing-Xin Chu

The second-order accurate FDTD technique at the dielectric interface is applied into the subgridding method. The second-order accuracy of the tangential electric fields at the interface can be implemented and the accuracy of the subgridding algorithm is improved. Numerical simulations of dielectric resonators are carried out and the better accuracy is shown in the proposed method than the standard FDTD methods.

Published in:
Electromagnetic Compatibility and 19th International Zurich Symposium on Electromagnetic Compatibility, 2008. APEMC 2008. Asia-Pacific Symposium on

Date of Conference: 19-23 May 2008

Page(s):
52 - 55
E-ISBN :
978-981-08-0629-3
Print ISBN:
978-981-08-0629-3
INSPEC Accession Number:
10104477
Conference Location :
Singapore
Digital Object Identifier :
10.1109/APEMC.2008.4559809

IEEE Account

Purchase Details

Profile Information

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.