By Topic

An ICP variant using a point-to-line metric

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Andrea Censi ; Control & Dynamical Systems department, California Institute of Technology, 1200 E. California Blvd., 91125, Pasadena, USA

This paper describes PLICP, an ICP (iterative closest/corresponding point) variant that uses a point-to-line metric, and an exact closed-form for minimizing such metric. The resulting algorithm has some interesting properties: it converges quadratically, and in a finite number of steps. The method is validated against vanilla ICP, IDC (iterative dual correspondences), and MBICP (Metric-Based ICP) by reproducing the experiments performed in Minguez et al. (2006). The experiments suggest that PLICP is more precise, and requires less iterations. However, it is less robust to very large initial displacement errors. The last part of the paper is devoted to purely algorithmic optimization of the correspondence search; this allows for a significant speed-up of the computation. The source code is available for download.

Published in:

Robotics and Automation, 2008. ICRA 2008. IEEE International Conference on

Date of Conference:

19-23 May 2008