By Topic

Nanoscale Pattern Definition on Nonplanar Surfaces Using Ion Beam Proximity Lithography and Conformal Plasma-Deposited Resist

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Parikh, D. ; Dept. of Electr. & Comput. Eng., Univ. of Houston, Houston, TX ; Craver, Barry ; Nounu, H.N. ; Fu-On Fong
more authors

Ion beam proximity lithography (IBL) is a technique where a broad beam of energetic light ions floods a stencil mask and transmitted beamlets transfer the mask pattern to resist on a substrate. With a depth-of-field up to 20000 times larger than the minimum feature size and the high-throughput potential of a parallel exposure tool, IBL is very attractive for prototyping and manufacturing nanoelectromechanical systems over the steep topography of micromachined silicon wafers. This paper reports a conformal resist coating process that unlocks this potential. This negative-tone resist, plasma-polymerized methyl methacry- late, has a sensitivity of 27 muC/cm2 and a contrast of 1.3 for 30-keV He+ ion exposures and amyl acetate developer. Sub-100-nm features have been printed down the sidewall and across a membrane at the bottom of a 500-mum-deep anisotropically etched pit in a silicon wafer. Pattern fidelity is near 2 nm for 10-nm features. Lines have also been formed on unpolished substrates, including rolled titanium foils and coarse-ground silicon wafers. Patterns on ground silicon have been etched into the surface using a nickel hard mask and SF6/O2 reactive ion etching.

Published in:

Microelectromechanical Systems, Journal of  (Volume:17 ,  Issue: 3 )