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This paper deals in crosstalk analysis of a CMOS-gate-driven capacitively and inductively coupled interconnect. Alpha power-law model of a MOS transistor is used to represent a CMOS driver. This is combined with a transmission-line-based coupled-interconnect model to develop a composite driver-interconnect-load model for analytical purposes. On this basis, a transient analysis of crosstalk noise is carried out. Comparison of the analytical results with SPICE extracted results shows that the average error involved in estimating noise peak and their time of occurrence is less than 7%.