By Topic

Test Techniques for Transient Radiation Effects

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
van Lint, V.A.J. ; General Atomic Division of General Dynamics Corporation, John Jay Hopkins Laboratory for Pure and Applied Science, San Diego, California ; Poll, R.A.

This paper gives examples of specific test techniques which have been used in performing transient radiation effects test measurements. The techniques were developed primarily for use with electron linear accelerators but can be applied directly in flash X-ray and pulsed reactor test programs as well.

Published in:

Aerospace and Navigational Electronics, IEEE Transactions on  (Volume:Technical_Paper ,  Issue: 0 )