By Topic

Test Generation with DHT Networks

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)

We propose in this paper to use DHT networks to cope with test generation for very large and complex systems. Indeed, conformance testing is known to be impracticable for this kind of systems. After a brief description of our first distributed environment used to deal with test generation, we propose to use the localization scheme of resources on DHT networks in order to distribute the specification among all peers. Our new algorithms are explained and described, and finally, seem to be, to the best of our knowledge, the first practicable solution usable for test generation for very large systems without specification.

Published in:

Information Technology: New Generations, 2008. ITNG 2008. Fifth International Conference on

Date of Conference:

7-9 April 2008