Cart (Loading....) | Create Account
Close category search window
 

Second-order statistics of large isometric matrices and applications to MMSE SIR

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Moustakas, A.L. ; Univ. of Athens, Athens ; Debbah, M.

In this paper we introduce a diagrammatic method to calculate asymptotic statistics of functions of large random isometric matrices. We have applied this method to calculate the mean and variance of the MMSE SIR for downlink synchronous CDMA systems. We compare our results to numerical simulations using three types of randomly generated isometric matrices, namely complex unitary Haar matrices, real orthogonal Haar matrices and orthogonal matrices generated from random sub- spaces of the N-dimensional real Hadamard matrix. While the first two types of matrices have good agreement with our analytic results, the Hadamard generated matrices give a consistently higher variance when the channel matrix is assumed to have a Toeplitz form. We argue that this discrepancy is due to the structure of eigenvectors of the Hadamard matrix.

Published in:

Signals, Systems and Computers, 2007. ACSSC 2007. Conference Record of the Forty-First Asilomar Conference on

Date of Conference:

4-7 Nov. 2007

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.