By Topic

Measurement of differential-mode and common-mode scattering parameters of symmetric coupled-line discontinuity structure

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Tseng, C.-H. ; Dept. of Electron. Eng., Nat. Taiwan Univ. of Sci. & Technol., Taipei ; Ma, T.-G.

The coupled-line thru-reflection-line (TRL) calibration technique is developed to measure the differential-mode (DM) and common-mode (CM) scattering parameters of the symmetric coupled-line discontinuity structure. Under DM and CM excitation conditions, a four-port symmetric coupled-line network can be treated as equivalent DM and CM two-port half-circuits. The developed coupled-line TRL calibrators can also be equivalent to DM and CM half-calibrators, and then applied to measure the DM and CM scattering parameters of the symmetric coupled-line discontinuity structure. To validate the effectiveness of the developed measurement method, the DM and CM characteristics of a coupled-line guided-wave structure, the periodically non-uniform coupled microstrip-line structure, are measured over the frequency range of 1-8 GHz. The measured results are shown in reasonable agreement with the simulated results. It demonstrates that the developed coupled-line TRL technique is an effective approach to characterise the symmetric coupled-line discontinuity structure.

Published in:

Microwaves, Antennas & Propagation, IET  (Volume:2 ,  Issue: 3 )