Cart (Loading....) | Create Account
Close category search window
 

Constriction of cone-beam artifacts by the Z-smart reconstruction method

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)

We introduce a novel approach for 3D image reconstruction from CB data acquired along a full circular trajectory. Our approach, which we refer to as the Z-smart reconstruction method, follows the scheme of ID filtering and 3D backprojection, while providing flexibility in the choice of the filtering directions. This flexibility allows us to modify the appearance of CB artifacts in the reconstruction results, so that, for certain imaging tasks, the Z-smart method can yield image quality that is significantly superior to that achievable with most other reconstruction algorithms for the full-scan circular trajectory. In particular, when imaging objects that have strong but localized heterogeneities in the axial direction, the Z-smart method can outperform both, the popular filtered-backprojection approach of Feldkamp et ah, and also ART, i.e. a fully 3D iterative reconstruction method. We provide a numerical evaluation of our algorithm using simulated CB data of an analytically defined tube phantom, with and without added noise.

Published in:

Nuclear Science Symposium Conference Record, 2007. NSS '07. IEEE  (Volume:6 )

Date of Conference:

Oct. 26 2007-Nov. 3 2007

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.