Scheduled System Maintenance:
Some services will be unavailable Sunday, March 29th through Monday, March 30th. We apologize for the inconvenience.
By Topic

RF MEMS Testing - Beyond the S-Parameters

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

The purchase and pricing options are temporarily unavailable. Please try again later.
3 Author(s)
Ebel, J.L. ; Wright-Patterson AFB, Wright-Patterson AFB ; Hyman, Daniel J. ; Newman, Harvey S.

This article surveys a variety of tests and measurements that have been used for switch and relay characterization, and it describes their strengths, weaknesses, and applicability in the design and development process.

Published in:

Microwave Magazine, IEEE  (Volume:8 ,  Issue: 6 )