By Topic

Demonstrating Reliability

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Chuck Goldsmith ; MEMtronics Corp., Plano ; John Maciel ; John Mckillop

This article highlights some of the recent reliability demonstrations for both ohmic and capacitive MEMS switches and provides a snapshot of the present state of RF MEMS switch reliability for upcoming military and commercial applications.

Published in:

IEEE Microwave Magazine  (Volume:8 ,  Issue: 6 )