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Single Event Upset Characterization of GHz Analog to Digital Converters with Dynamic Inputs Using a Beat Frequency Test Method

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5 Author(s)
Kirby Kruckmeyer ; National Semiconductor, Santa Clara, CA 95052, telephone: 408-721-3548, email: ; Robert L. Rennie ; Dawn H. Ostenberg ; Vishwanath Ramachandran
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Typically, single event upset (SEU) testing of analog to digital converters (ADC) has been done with static inputs. A test method, using a beat frequency and code error detection software, is presented. This test method allows for SEU characterization of ultra high speed ADC's, using dynamic inputs that more closely reflect the operating conditions in a space application. The test method is demonstrated on National Semiconductor's ADC08D1000WG-QV at 1 gigasample per second (GSPS) and an input frequency close to 1 GHz. A discussion of the SEU signatures and error rates are also presented.

Published in:

2007 IEEE Radiation Effects Data Workshop  (Volume:0 )

Date of Conference:

23-27 July 2007