By Topic

Modes of Failure of Electrical Connectors

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Shearer, J.F. ; The Pyle-National Company 1334 North Kostner Avenue Chicago 51, Illinois

This paper discusses techniques for evaluating and predicting a connector's performance by appling the principles of stress analysis to individual sub-assemblies which ultimately make up a complete, functioning connector. The author discusses the relationship of environment to material and surmises that the resultant of environmental conditions is stress in materials which may ultimately cause a failure in connector performance. In other words, a connector may be evaluated on the basis of the materials used therein and the ability of these materials to withstand the environmental conditions imposed upon them.

Published in:

Aerospace, IEEE Transactions on  (Volume:2 ,  Issue: 2 )