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Nonsaturating Transistor Circuitry for Nanosecond Pulses

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1 Author(s)
Sugarman, Robert M. ; Brookhaven Natl. Lab., Upton, N.Y.

A system is described for pulse testing of transistors in the 10-10 to 10-9 sec range. Based on these measurements, a nanosecond, current switching, multiple coincidence system has been constructed. It is dc coupled and has input pulse limiters and clipping stubs. A ten-nonosecond scaler-discririnator stage is discussed which also employs current switching techniques. One output is scaled for pulse counting; another unscaled output is used to drive coincidence circuitry.

Published in:

Nuclear Science, IRE Transactions on  (Volume:7 ,  Issue: 1 )