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New Test Method for the Pulse Immunity of Microcontrollers

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4 Author(s)
Tao Su ; Infineon Technol. AG, Neubiberg ; Unger, M. ; Steinecke, T. ; Weigel, R.

The paper presents a new test method for pulse susceptibility of microcontrollers which reflects the electromagnetic environment of microcontrollers in practical applications. The method includes a set of electromagnetic interference pulses and their injection networks. The waveforms of the pulses are deduced from measurements on real application boards of microcontrollers.

Published in:
Electromagnetic Compatibility, 2007. EMC 2007. IEEE International Symposium on

Date of Conference: 9-13 July 2007

Page(s):
1 - 6
E-ISBN :
1-4244-1350-8
Print ISBN:
1-4244-1350-8
INSPEC Accession Number:
9830202
Conference Location :
Honolulu, HI
Digital Object Identifier :
10.1109/ISEMC.2007.12

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