By Topic

Cross-Layer Measurements for a Comprehensive Characterization of Wireless Networks in the Presence of Interference

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Angrisani, L. ; Univ. degli Studi di Napoli II, Napoli ; Vadursi, M.

Assessing the overall performance of wireless communication networks is of key importance for optimal management and planning. With special regard to wireless networks operating in an unlicensed band, evaluating overall performance mainly implies facing the coexistence issues, which are associated with the contemporaneous presence of true and interfering signals at the physical layer. This task is difficult to fulfill only on the basis of single-layer measurements, if not prohibitive; a partial perspective of network behavior would, in fact, be gained. With this concern, a cross-layer approach is presented hereinafter. It provides for several measurements to be concurrently carried out at different layers through a proper automatic station. It aims to correlate the values of the major physical-layer quantities (e.g., channel power and signal-to-interference ratio) exhibited by those characterizing the key higher layers' parameters (e.g., packet-loss ratio and one-way delay) in the presence of interference. A first step toward a full characterization of how the effects of a problem, which is experienced at the physical layer, propagates along the whole protocol stack, can thus be taken.

Published in:

Instrumentation and Measurement, IEEE Transactions on  (Volume:56 ,  Issue: 4 )