By Topic

Picometer Resolution Wavelength Tracking in the C -Band Using an InP–InGaAsP Dual-Slab Interferometer

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Cassidy, David R. ; Durham Univ., Durham ; Cross, Graham H.

A simple III-V semiconductor dual-slab waveguide interferometer is demonstrated which can detect picometer level changes in the C-band laser wavelength. Optical path length imbalance between the two single-slab waveguide modes provides the primary mechanism for detection. The dual-mode output field phase change differences due to input wavelength changes are encoded in shifts in the device output far-field interference pattern. The device detects path length dependent wavelength changes with a phase change difference sensitivity of around 660 mrad/nmldrmm at 1.55 mum and a phase detection floor of plusmn1 mrad. The transverse electric and transverse magnetic polarization responses are approximately equivalent.

Published in:

Photonics Technology Letters, IEEE  (Volume:19 ,  Issue: 14 )