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Diagnostic Performance of Combined Tests using a Generation Algorithm of Multiple Tests with Arbitrary Sensitivity, Specificity and Correlation

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9 Author(s)
Ikeda, N. ; Department of Medical Engineering, School of Allied Health Sciences, Kitasato University, Kanagawa, JAPAN; Medical Informatics, Graduate School of Medical Sciences, Kitasato University, Kanagawa, JAPAN. ikeda@kitasato-u.ac.jp ; Shibata, S. ; Bax, L. ; Henmi, O.
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A generation algorithm of multiple test data of binary values with arbitrary sensitivity, specificity and correlation is presented. Diagnostic performance of combined multiple tests is studied using simulation data generated by this method, and theoretical considerations for a simple case are reviewed.

Published in:

Advances in Medical, Signal and Information Processing, 2006. MEDSIP 2006. IET 3rd International Conference On

Date of Conference:

17-19 July 2006