By Topic

Statistical Variations Are Inevitable - Can We Cope With Them?

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

The ever-decreasing size of wires and transistors on VLSI chips has driven the revolution in electronics over the past several decades. The features in advanced chips are now so small that variations in numbers of photons and numbers of atoms matter. Lithography of subwavelength device dimensions and statistical variations in the numbers of dopant atoms that elicit transistor behavior result in significant variation in the electrical properties of tiny transistors. Such variations are an inevitable consequence of miniaturization revealing the quantized nature of light and matter.

Published in:

Asynchronous Circuits and Systems, 2007. ASYNC 2007. 13th IEEE International Symposium on

Date of Conference:

March 2007