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Nanostructured Materials Studied by Means of the Computed Field Ion Image Tomography (CFIIT)

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4 Author(s)
Catharina Wille ; Institut fuer Materialphysik, Universitaet Goettingen, Friedrich-Hund-Platz 1, 37077 Goettingen, Germany ; Talaat Al-Kassab ; Alexander Heinrich ; Reiner Kirchheim

A new technique for transmission electron microscopy and atom probe tomography of nanocrystalline materials is developed based on field ion microscopy (FIM). The computed field ion image tomography (cFIIT) uses stacked field ion micrographs to reconstruct volumes 102 to 103 times larger than those from tomographic atom probe. This method also makes it possible to create "virtual" FIM images in order to visualise nanoscopic microstructures and provides orientation information to obtain the distances between grain boundary precipitates

Published in:

2006 19th International Vacuum Nanoelectronics Conference

Date of Conference:

July 2006