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Data Acquisition System and Reference Model Used for the Investigation and Verification of the Resistance Tomography System

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2 Author(s)
Mykhaylo M. Dorozhovets ; Department of Information and Measuring Technology, National University "Lviv Polytechnic", S. Bandera, 12, St. 79013, Lviv, Ukraine,; Department of Metrology and Measuring System, Rzeszow University of Technology, W. Pola, 2, St. 35-959, Rzeszow, Poland, ; Pawel Potyranski

In this paper the data acquisition system (DAQ) and metrology verification technique of electrical resistivity tomography system is proposed and investigated. The verification is based on the reference model of resistivity distribution that is constructed as a network of the discrete resistors. Proposed technique permits to verify the DAQ, reconstruction algorithm and approximation effects jointly or separately. The reference network parameters and the stages of the verification algorithm are in details described. The DAQ 6-12-24-electrodes object current excitation and interelectrode voltage measurement using difference method.

Published in:

2005 IEEE Intelligent Data Acquisition and Advanced Computing Systems: Technology and Applications

Date of Conference:

5-7 Sept. 2005