By Topic

Data Acquisition System and Reference Model Used for the Investigation and Verification of the Resistance Tomography System

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Dorozhovets, M.M. ; Dept. of Inf. & Meas. Technol., Nat. Univ. Lviv Polytech., Lviv ; Potyranski, P.

In this paper the data acquisition system (DAQ) and metrology verification technique of electrical resistivity tomography system is proposed and investigated. The verification is based on the reference model of resistivity distribution that is constructed as a network of the discrete resistors. Proposed technique permits to verify the DAQ, reconstruction algorithm and approximation effects jointly or separately. The reference network parameters and the stages of the verification algorithm are in details described. The DAQ 6-12-24-electrodes object current excitation and interelectrode voltage measurement using difference method.

Published in:

Intelligent Data Acquisition and Advanced Computing Systems: Technology and Applications, 2005. IDAACS 2005. IEEE

Date of Conference:

5-7 Sept. 2005