By Topic

Impact of Supply Voltage Variations on Full Adder Delay: Analysis and Comparison

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Alioto, M. ; Dipt. di Ingegneria dell''Informazione (DII), Siena Univ. ; Palumbo, G.

In this paper, some of the most practically interesting full adder topologies are analyzed in terms of their delay dependence on the supply voltage fluctuations, which are a major contribution to the delay uncertainty, which in turn limits the speed performance of current VLSI circuits. Analytical models of the delay sensitivity with respect to supply variations are derived by following a simplified circuit analysis, and the resulting expressions are simple enough to afford a deeper insight into the impact of supply voltage variations on each topology. The models are shown to be sufficiently accurate through simulations with CMOS technologies having a minimum feature size ranging from 90 nm to 0.35 mum. Several interesting properties and design considerations are derived from these models, and the effect of the supply voltage scaling, technology scaling, transistor sizing, and input transition time is discussed. Strategies to evaluate the delay sensitivity since the early design phases (e.g., from ring oscillator measurements) are also introduced. As a fundamental result, it is shown that the delay sensitivity to supply variations will increase in the next technology nodes, thus, it is expected that controlling the supply variations will be an increasingly important issue in the design of the next generation VLSI circuits. The proposed methodology is also analyzed in the case of more general digital circuits, and is used to estimate the impact of the inter-die threshold voltage variations on the delay of the considered full adder topologies

Published in:

Very Large Scale Integration (VLSI) Systems, IEEE Transactions on  (Volume:14 ,  Issue: 12 )