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A Precision Resonance Method for Measuring Dielectric Properties of Low-Loss Solid Materials in the Microwave Region

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2 Author(s)
S. Saito ; Institute of Industrial Science, Univ. of Tokyo, Tokyo, Japan ; K. Kurokawa

A precision resonance method for measuring the dielectric properties of low loss solid materials has been developed in our laboratory. The dielectric sample to be measured is shaped into a cylindrical disk and inserted into a cylindrical cavity resonator oscillating in the T10, mode. ¿ can be measured from the difference between the axial lengths of the cavity tuned to the same frequency with and without the sample, and tan a can be found from the difference between the Q's of the cavity with and without the sample. By making use of a special marker of a resonance point on an oscilloscope, the measurements accuracy can be improved to yield only 1 per cent error in ¿ and 3 per cent error in tan a for various low-loss samples. Such materials as polystyrol, polyethylene, teflon, and glass for high-frequency use were tested at 4,000 mc, 9,000 mc and 24,000 mc.

Published in:

Proceedings of the IRE  (Volume:44 ,  Issue: 1 )