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Designing in reliability with standard cells

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3 Author(s)
Brown, T.H. ; NCR Microelectron., Colorado Springs, CO, USA ; Locke, D.G. ; Daughton, W.

The authors show the advantages of using generic standard-cell data in qualifying a military product. They describe the proposed methodology used in qualifying ASIC (application-specific integrated circuit) standard-cell devices for military use. Reliability results of using standard cells and recommendations for qualifying military standard-cell products are presented. It is noted that this new approach to qualifying ASIC standard-cell library devices for a military environment allows new designs to be introduced at a minimal cost and insures reliability at the same time

Published in:

Aerospace and Electronics Conference, 1989. NAECON 1989., Proceedings of the IEEE 1989 National

Date of Conference:

22-26 May 1989