Cart (Loading....) | Create Account
Close category search window
 

Radiographs as medical documents: automating standard measurements

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Dori, D. ; Fac. of Ind. Eng. & Manage., Technion, Haifa, Israel ; Harris, A.I. ; Gambach, G. ; Haralick, R.M.

A program has been initiated to automate certain radiographic measurements. The edge detection step is discussed. An edge detection model is presented for standard radiographs, which will be the basis for the measurements step. In particular, the edges of interest are modeled as a linear combination of basis functions. The problem of edge detection is then presented as a supervised pattern recognition problem in which the parameters of the basis functions are learned during the training phase, and the recognition phase uses these learned parameters to locate pixels that belong to edges. Since edges may appear in any direction, the mathematical tools to determine the gradient direction of the edge are developed

Published in:

Document Analysis and Recognition, 1993., Proceedings of the Second International Conference on

Date of Conference:

20-22 Oct 1993

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.