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ASLCScan: A scan design technique for asynchronous sequential logic circuits

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3 Author(s)
Chin-Long Wey ; Dept. of Electr. Eng., Michigan State Univ., East Lansing, MI, USA ; Shieh, M.-D. ; Fisher, P.D.

Asynchronous sequential logic circuits (ASLCs) are synthesized with either the Huffman model, referred to as HMASLCs, or with the signal transition graph (STG), referred to as STGASLCs. Based on a single stuck-at fault model, this paper describes fault effects for both HMASLCs and STGASLCs and addresses the similarities and differences between them. The fault effects include redundant faults and state oscillations. Input/output redundancy is a special feature of STGASLCs which relaxes the fundamental mode in HMASLCs. Results of this study show that the faults due to the input/output concurrency cannot be tested without a scan structure. This paper presents a scan design technique. ASLCScan. With this structure, the test generation problem is reduced to one of just testing the combinational logic

Published in:

Computer Design: VLSI in Computers and Processors, 1993. ICCD '93. Proceedings., 1993 IEEE International Conference on

Date of Conference:

3-6 Oct 1993