Cart (Loading....) | Create Account
Close category search window
 

Efficient verification of symmetric concurrent systems

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Ip, C.N. ; Dept. of Comput. Sci., Stanford Univ., CA, USA ; Dill, D.L.

Previously (Proc. 11th Symp. on Computer Hardware Description Languages and their Application, April 1993), we proposed a reduction technique based on symmetries to alleviate the state explosion problem in automatic verification of concurrent systems. This paper describes the results of testing the technique on a wide range of algorithms and protocols, including realistic multiprocessor synchronization algorithms and cache coherence protocols. Memory requirements were reduced by amounts ranging from 83% to over 99%, and time requirements were often reduced as well. We also consider the effectiveness of the technique on different types of symmetries, such as symmetries in identical system components and symmetries in data values

Published in:

Computer Design: VLSI in Computers and Processors, 1993. ICCD '93. Proceedings., 1993 IEEE International Conference on

Date of Conference:

3-6 Oct 1993

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.