By Topic

Design guidelines and testability assessment

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
B. R. Wilkins ; Dept. of Electron. & Comput. Sci., Southampton Univ., UK ; C. Shi

A major problem in the manufacture of electronic systems lies in the conflict between the demands of the designer for optimum performance and the requirements of the production engineer for adequate testability. Design for testability guidelines have been well established for many years, but are still today being urged on an apparently reluctant industry. The purpose of the guidelines is to ensure that the manufactured product is economically and efficiently testable; the main management tool for this purpose is the design and test review process, but in practice this does not seem to have been successful in preventing designs with poor testability from reaching production. The paper considers possible reasons for nonconformance with testability guidelines, and suggests changes in procedure that will allow management to exert more effective control on the process

Published in:

Computer Design: VLSI in Computers and Processors, 1993. ICCD '93. Proceedings., 1993 IEEE International Conference on

Date of Conference:

3-6 Oct 1993