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Φ-test: Perfect hashed index test for test response validation

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1 Author(s)
Gupta, R. ; General Electric Corp. R&D, Schenectady, NY, USA

A scheme called Φ-test for checking the fidelity of test responses generated by a specially tailored sequence of test inputs is described. Φ-test, which performs the checks without storing the test responses in any manner, can be used for fault diagnosis and isolation in (1) embedded combinational or sequential logic, and (2) a system of units connected via a bus. Unlike signature analysis, Φ-test flags the offending values in case of discrepancy, thereby exposing the test inputs (and by implication, the devices) that generated them

Published in:

Computer Design: VLSI in Computers and Processors, 1993. ICCD '93. Proceedings., 1993 IEEE International Conference on

Date of Conference:

3-6 Oct 1993