Cart (Loading....) | Create Account
Close category search window
 

Hazards, critical races, and metastability

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Unger, S.H. ; Dept. of Comput. Sci., Columbia Univ., New York, NY, USA

The various modes of failure of asynchronous sequential logic circuits due to timing problems are considered. These are hazards, critical races and metastable states. It is shown that there is a mechanism common to all forms of hazards and to metastable states. A similar mechanism, with added complications, is shown to characterize critical races. Means for defeating various types of hazards and critical races through the use of one-sided delay constraints are introduced. A method is described for determining from a flow table situations in which metastable states may be entered. A circuit technique is presented for extending a previously known technique for defeating metastability problems in self-timed systems. It is shown that the use of simulation for verifying the correctness of a circuit with given bounds on the branch delays cannot be relied upon to expose all timing problems. An example is presented that refutes a plausible conjecture that replacing pure delays with inertial delays can never introduce, but only eliminate glitches

Published in:

Computers, IEEE Transactions on  (Volume:44 ,  Issue: 6 )

Date of Publication:

Jun 1995

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.