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LFSROM: Basic Principle and BIST application

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2 Author(s)
Dufaza, C. ; UMR-CNRS, Univ. Montpellier II, France ; Chevalier, C.

A built-in self test (BIST) approach wherein the on-chip test pattern generator is basically the combination of a LFSR, on OR2 network and a set of multiplexers is described. Given precomputed sequences of deterministic test vectors, it is illustrated by some examples that this LFSROM generator provides data storage performances comparable in quality to a ROM

Published in:

Design Automation, 1993, with the European Event in ASIC Design. Proceedings. [4th] European Conference on

Date of Conference:

22-25 Feb 1993