By Topic

Synthesis of weighted random sequences with application to testing of sequential circuits

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Gloster, C. ; ECE Dept., North Carolina State Univ., Raleigh, NC, USA ; Brglez, F.

The weights are stored and a weighted random sequence generator is used to produce the required test sequences during testing rather than storing the actual test sequence themselves. The generation of required weights is based on the dynamic scan algorithm, DYNASTEE. Experimental results demonstrate tradeoffs in test application time and in tester memory requirements, while maintaining 100% fault coverage of all target faults

Published in:

Design Automation, 1993, with the European Event in ASIC Design. Proceedings. [4th] European Conference on

Date of Conference:

22-25 Feb 1993