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Latent open defect detection using phase-sensitive nonlinearity detection technique

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3 Author(s)
A. Halperin ; IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA ; T. H. DiStefano ; Shinwu Chiang

Alternating and direct electric currents are applied through the metal interconnections in electronic packaging to detect potential electrical opens, such as line narrowings, notches, nicks, cracks, weak connections, and interface contaminations. Due to the nonlinear relationship between the voltage across and current through the metal conductor, distortion signals are generated by the defect region as well as the good conductor. The signal generated from a latent open defect can be detected by comparing the defect signal phase with the reference phase produced by the good conductor. Application of this technique to electronic packaging development and manufacturing can improve product reliability and reduce cost by early detection of latent open defects

Published in:

IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part B  (Volume:18 ,  Issue: 2 )