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Parametric yield prediction of complex, mixed-signal ICs

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2 Author(s)
M. O'Leary ; Nat. Microelectron. Res. Centre, Univ. Coll. Cork, Ireland ; C. Lyden

A method is presented which helps the designer to quickly predict the parametric yield of complex, mixed-signal ICs. It builds on previous approaches which use behavioural simulation, regression modelling and a hierarchical approach to perform this task. A novel enhancement is proposed which overcomes some of the inaccuracies introduced from using regression models to generate predictions for test result distributions

Published in:

Custom Integrated Circuits Conference, 1994., Proceedings of the IEEE 1994

Date of Conference:

1-4 May 1994