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Diagnosing CMOS bridging faults with stuck-at, IDDQ, and voting model fault dictionaries

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2 Author(s)
Millman, S.D. ; Motorola Inc., Tempe, AZ, USA ; Acken, J.M.

Fault dictionaries for the stuck-at fault model are not appropriate for diagnosing CMOS bridging faults. This paper shows that for CMOS circuits containing bridging faults, either IDDQ or the voting model is needed for correct diagnosis. However, a technique based upon the voting model that uses stuck-at fault dictionaries to diagnose bridging faults is described. When the traditional stuck-at fault technique is used, between 30-50% of the bridging faults resulted in a misleading diagnosis which indicated the presence of the failure on a fault-free node. In addition, as the stuck-at fault diagnostic ability of a test increased, the bridging fault diagnostic ability decreased

Published in:

Custom Integrated Circuits Conference, 1994., Proceedings of the IEEE 1994

Date of Conference:

1-4 May 1994