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Reliability comparisons for plastic-encapsulated microcircuits

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2 Author(s)
Baker, B. ; Texas Instrum. Inc., Sherman, TX, USA ; Martin, S.

This paper briefly compares reliability test data obtained from plastic encapsulated microcircuits (PEM) purchased from various manufacturers. Tests include biased humidity, temperature cycling, autoclave, and life tests. The results indicate differences in reliability associated with PEM from the various manufacturers. These data highlight the need for a thorough understanding of supplier quality and reliability

Published in:

Reliability, IEEE Transactions on  (Volume:44 ,  Issue: 1 )