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Behavioral testability and test pattern generation of the Hopfield network model

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5 Author(s)
C. Alippi ; Dipartimento di Elettronica e Inf., Milan Univ., Italy ; F. Fummi ; V. Piuri ; M. Sami
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The problem of testability and test pattern generation at the highest abstraction level, i.e., based on the network's behavior, is considered for Hopfield networks. Complete testability is proved. A test pattern generation approach based on creation of an equivalent finite state machine is presented, the functional test pattern generation have been proved to allow very high coverage of logic-level faults in the case of finite state machines. An efficient algorithm, using BDDs, is finally described

Published in:

Neural Networks, 1994. IEEE World Congress on Computational Intelligence., 1994 IEEE International Conference on  (Volume:7 )

Date of Conference:

27 Jun-2 Jul 1994