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Worst-case analysis and optimization of VLSI circuit performances

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2 Author(s)
Dharchoudhury, A. ; Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA ; Kang, S.M.

In this paper, we present a new approach for realistic worst-case analysis of VLSI circuit performances and a novel methodology for circuit performance optimization. Circuit performance measures are modeled as response surfaces of the designable and uncontrollable (noise) parameters. Worst-case analysis proceeds by first computing the worst-case circuit performance value and then determining the worst-case noise parameter values by solving a nonlinear programming problem. A new circuit optimization technique is developed to find an optimal design point at which all of the circuit specifications are met under worst-case conditions. This worst-case design optimization method is formulated as a constrained multicriteria optimization. The methodologies described in this paper are applied to several VLSI circuits to demonstrate their accuracy and efficiency

Published in:

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:14 ,  Issue: 4 )