Close category search window
 

Bit error probability approximation for DS/CDMA with M-ary orthogonal modulation in multipath fading channels

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Jalloul, L.M.A. ; Wireless Inf. Network Lab., Rutgers Univ., Piscataway, NJ, USA ; Holtzman, J.M.

The performance of a DS/CDMA system using M-ary orthogonal modulation with noncoherent demodulation is evaluated. The system operates in a multipath fading channel. A RAKE receiver structure with equal gain combining is used for demodulation. An approximation to the bit error probability is given which depends only on the first and second order moments of the multipath energies. The analysis results are compared with the results from computer simulations. It is seen that the approximation is accurate for multipath energies with realistic coefficient of variation. The approximation is also used to evaluate the capacity reductions due to power variations caused by multipath fading

Published in:
Communications, 1994. ICC '94, SUPERCOMM/ICC '94, Conference Record, 'Serving Humanity Through Communications.' IEEE International Conference on

Date of Conference: 1-5 May 1994

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.