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Sequential test generation in massive observability environments

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1 Author(s)
Varma, P. ; CrossCheck Technol. Inc., San Jose, CA, USA

This paper describes a sequential test generation method for circuits in massive observability environments such as those offered by quiescent current monitoring and gate arrays with embedded test points. Techniques to enhance the controllability of the circuit are also discussed and an algorithm for selecting storage elements to make accessible during the test mode is proposed

Published in:

Test Symposium, 1994., Proceedings of the Third Asian

Date of Conference:

15-17 Nov 1994