Referenced Items are not available for this document.
Pseudo-random patterns with equi-distribution given by some phase-shifted M-sequences are often used to produce random numbers used in simulations and test patterns in VLSI tests. Low linear dependency is one of the desirable and important properties of random patterns as well as equi-distribution. This paper discusses pseudo-random patterns with equi-distribution and low linear dependence
Published in:
Test Symposium, 1994., Proceedings of the Third Asian
Date of Conference: 15-17 Nov 1994
- Page(s):
- 274 - 279
- Meeting Date :
- 15 Nov 1994-17 Nov 1994
- Print ISBN:
- 0-8186-6690-0
- INSPEC Accession Number:
- 4868990
- Conference Location :
- Nara
- Digital Object Identifier :
- 10.1109/ATS.1994.367219
- Product Type:
- Conference Publications
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