A built-in self-test approach for medium to high-resolution digital-to-analog converters

A test approach and circuitry suitable for built-in self-test (BIST) of medium to high-resolution digital-to-analog (D/A) converter are described. Offset, gain, linearity and differential linearity errors are tested without using mixed-mode or logic test equipment. The proposed BIST structure presents a compromise between test cost, area overhead and test time. The BIST circuitry has been designed using CMOS 1.2 μm technology. The simulations performed show that the BIST is applicable for testing D/A converters up to 16-bits resolution. By a minor modification the test structure would be able to localize the fail situation and to test all D/A converters on the chip