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A BIST scheme for a SNR, gain tracking, and frequency response test of a sigma-delta ADC

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2 Author(s)
M. F. Toner ; Dept. of Electr. Eng., McGill Univ., Montreal, Que., Canada ; G. W. Roberts

Built-in-self test (BIST) for VLSI systems is desirable in order to reduce the cost per chip of production-time testing by the manufacturer. In addition, it can provide the means to perform in-the-field diagnostics. This paper discusses a mixed analog-digital BIST (MADBIST) for a signal-to-noise-ratio test, gain tracking test, and frequency response test of a sigma-delta analog-to-digital converter. The MADBIST strategy for the SNR, GT, and FR tests of the ADC is introduced, accuracy issues are discussed, and experimental results are presented

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IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing  (Volume:42 ,  Issue: 1 )