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Taking advantage of ASICs to improve dependability with very low overheads [PLC]

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5 Author(s)
T. Michel ; INPG/CSI, Grenoble, France ; R. Leveugle ; G. Saucier ; R. Doucet
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On-line test mechanisms have been designed for the CPU of a programmable logic controller. Specific devices integrated in an ASIC processor perform control flow checking during both application and system program executions. A prototype has been implemented, demonstrating the very low overhead of the approach. Results of fault injections have then proved the dependability increase at system level

Published in:

European Design and Test Conference, 1994. EDAC, The European Conference on Design Automation. ETC European Test Conference. EUROASIC, The European Event in ASIC Design, Proceedings.

Date of Conference:

28 Feb-3 Mar 1994