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Efficient path identification for delay testing - time and space optimization

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2 Author(s)
Wittman, H. ; Inst. of Electron. Design Autom., Tech. Univ. Munchen, Germany ; Henftling, M.

This paper presents an efficient method of handling a large number of paths during path-delay fault testing. Instead of handling the corresponding set of signals, an identifier is derived for every path. We handle up to three billion paths because the memory requirement is only about three bits per path. Compared to former approaches, experimental results show fast access, small memory requirements, and negligible CPU-times for the management of huge path sets

Published in:
European Design and Test Conference, 1994. EDAC, The European Conference on Design Automation. ETC European Test Conference. EUROASIC, The European Event in ASIC Design, Proceedings.

Date of Conference: 28 Feb-3 Mar 1994

Page(s):
513 - 517
Meeting Date :
28 Feb 1994-03 Mar 1994
Print ISBN:
0-8186-5410-4
INSPEC Accession Number:
4682319
Conference Location :
Paris
Digital Object Identifier :
10.1109/EDTC.1994.326827
Product Type:
Conference Publications

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