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CAD-based net capacitance testing of unpopulated MCM substrates

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4 Author(s)
J. Marshall ; Acuson Computer Sonography, Mountain View, CA, USA ; F. C. Chong ; D. Modlin ; S. Westbrook

This paper presents an approach to CAD-based generation of expected test values for capacitive net verification in unpopulated multiple-chip modules (MCMs). The superposition model underlying the capacitance estimation technique is discussed along with implementation details and test results from CAD-based testing of DEC VAX-9000 MCMs

Published in:

IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part B  (Volume:17 ,  Issue: 1 )